Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials
Reference54 articles.
1. R.M.A. Azzam, N.M. Bashara, Ellipsometry and Polarized Light, North Holland, Amsterdam, 1977.
2. Recent developments in instrumentation in ellipsometry
3. Data analysis for spectroscopic ellipsometry
4. The calculation of thin film parameters from spectroscopic ellipsometry data
5. R.A. Chipman, Handbook of Optics, vol. II, 2nd ed., McGraw-Hill, New York, 1995, Ch. 22.
Cited by
347 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献