Improvement of Swanepoel method for deriving the thickness and the optical properties of chalcogenide thin films-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Improvement of Swanepoel method for deriving the thickness and the optical properties of chalcogenide thin films

Published:2017-01-06 Issue:1 Volume:25 Page:440
ISSN:1094-4087
Container-title:Optics Express
language:en
Short-container-title:Opt. Express

Author:

Jin Youliang,Song Baoan,Jia Zhitai,Zhang Yinan,Lin Changgui,Wang Xunsi,Dai Shixun

Funder

K.C. Wong Magna Fund

Natural Science Foundation of Zhejiang Province

State Key Laboratory of Crystal Material

Publisher

The Optical Society

Subject

Atomic and Molecular Physics, and Optics

Reference28 articles.

1. Thin-film solar cells: review of materials, technologies and commercial status

2. Survey of methods to characterize thin absorbing films with Spectroscopic Ellipsometry

3. Optical constants of CH_3NH_3PbBr_3 perovskite thin films measured by spectroscopic ellipsometry

4. Generalized ellipsometry in-situ quantification of organic adsorbate attachment within slanted columnar thin films

5. Determination of layer thickness and optical constants of thin films by using a modified pattern search method

Cited by 52 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Oxidation characteristics of copper oxide thin films deposited by direct current sputtering under substrate temperature and post-deposition copper-ion implantation;Thin Solid Films;2024-09

2. Transparent superhydrophilic acrylic resin@GO-Fe3O4 coatings for glass surfaces with highly efficient visible-light-induced self-cleaning and anti-fogging properties;Surfaces and Interfaces;2024-09

3. Impact of post deposition treatment on optoelectrical and microstructural properties of tin sulfide thin film for photovoltaic applications;Physica Scripta;2024-06-06

4. Optical parameter determination of amorphous semiconductor thin films for photovoltaic device modeling;AIP Conference Proceedings;2024

5. Insights into the properties and possible bonding states of radiofrequency-magnetron-sputtered indium tin oxide thin films acquired using ultraviolet–visible spectroscopy data for cost-effective material characterization;Optical Materials;2023-12

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号京ICP备18003416号-3