Rapid multiplex ultrafast nonlinear microscopy for material characterization

Author:

Purz Torben L.1ORCID,Hipsley Blake T.1ORCID,Martin Eric W.2ORCID,Ulbricht Ronald3,Cundiff Steven T.12ORCID

Affiliation:

1. University of Michigan

2. MONSTR Sense Technologies, LLC

3. Max Planck Institute for Polymer Research

Abstract

We demonstrate rapid imaging based on four-wave mixing (FWM) by assessing the quality of advanced materials through measurement of their nonlinear response, exciton dephasing, and exciton lifetimes. We use a WSe2 monolayer grown by chemical vapor deposition as a canonical example to demonstrate these capabilities. By comparison, we show that extracting material parameters such as FWM intensity, dephasing times, excited state lifetimes, and distribution of dark/localized states allows for a more accurate assessment of the quality of a sample than current prevalent techniques, including white light microscopy and linear micro-reflectance spectroscopy. We further discuss future improvements of the ultrafast FWM techniques by modeling the robustness of exponential decay fits to different spacing of the sampling points. Employing ultrafast nonlinear imaging in real-time at room temperature bears the potential for rapid in-situ sample characterization of advanced materials and beyond.

Funder

National Science Foundation

U.S. Department of Energy

Publisher

Optica Publishing Group

Subject

Atomic and Molecular Physics, and Optics

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