Author:
Purz Torben L.,Martin Eric W.,Alfrey Adam,Cao Yuhang,Deng Hui,Cundiff Steven T.
Abstract
We demonstrate a rapid non-contact determination of layer thickness for exfoliated transition metal dichalcogenides using hyperspectral four-wave mixing imaging, which can be applied for in-situ growth characterization. We corroborate the measurements using atomic force microscopy.