Using Bessel beams and two-photon absorption to predict radiation effects in microelectronics
Author:
Funder
Defense Threat Reduction Agency
Office of Naval Research
Publisher
The Optical Society
Subject
Atomic and Molecular Physics, and Optics
Reference28 articles.
1. Pulsed-Laser Testing for Single-Event Effects Investigations
2. The Use of Lasers to Simulate Radiation-Induced Transients in Semiconductor Devices and Circuits
3. Application of a pulsed laser for evaluation and optimization of SEU-hard designs [CMOS]
4. Pulsed laser-induced single event upset and charge collection measurements as a function of optical penetration depth
5. Correlation of picosecond laser-induced latchup and energetic particle-induced latchup in CMOS test structures
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