A carrier removal method in phase measuring deflectometry based on the analytical carrier phase description
Author:
Publisher
The Optical Society
Subject
Atomic and Molecular Physics, and Optics
Reference10 articles.
1. Phase measuring deflectometry: a new approach to measure specular free-form surfaces
2. Dynamic three-dimensional sensing for specular surface with monoscopic fringe reflectometry
3. Superfast phase-shifting method for 3-D shape measurement
4. Fast phase-unwrapping algorithm based on a gray-scale mask and flood fill
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1. Deep learning-based Phase Measuring Deflectometry for single-shot 3D shape measurement and defect detection of specular objects;Optics Express;2022-07-07
2. 3D reconstruction of the specular surface using an iterative stereoscopic deflectometry method;Optics Express;2021-04-12
3. A single-shot phase retrieval method for phase measuring deflectometry based on deep learning;Optics Communications;2020-12
4. Detection of specular surface defects with eliminating dusts based on polarized structured-light illumination;9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment;2019-01-18
5. Performance Analysis and Evaluation of Geometric Parameters in Stereo Deflectometry;Engineering;2018-12
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