Detection of specular surface defects with eliminating dusts based on polarized structured-light illumination-Reference-Cited by-同舟云学术

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Detection of specular surface defects with eliminating dusts based on polarized structured-light illumination

Published:2019-01-18 Issue: Volume: Page:
ISSN:
Container-title:9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment
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Author:

Song Yiping,Yue Huimin,Zhou Zheng,Huang Yiyang,Fang Yuyao,Liu Yong

Publisher

SPIE

Reference13 articles.

1. Defect inspection and extraction of the mobile phone cover glass based on the principal components analysis.;Di;International Journal of Advanced Manufacturing Technology,2014

2. Glass Defect Detection Techniques using Digital Image Processing –A Review.;Nishu;Ip Multimedia Communications,2011

3. Image processing for automatic surface defect detection.;Coulthard,1989

4. Phase measuring deflectometry: a new approach to measure specular free-form surfaces

5. Phase error analysis and reduction in phase measuring deflectometry.;Yuxiang;Optical Engineering,2015

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Defect Algorithm for Ultra-Thin Flexible Glass Surfaces Based on Parallel Light Scanning;2023 International Conference on Artificial Intelligence and Automation Control (AIAC);2023-11-17

2. The implication and evaluation of geometrical imperfections on manufactured surfaces;CIRP Annals;2022

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