Investigation of ablation thresholds of optical materials using 1-µm-focusing beam at hard X-ray free electron laser-Reference-Cited by-同舟云学术

Investigation of ablation thresholds of optical materials using 1-µm-focusing beam at hard X-ray free electron laser

Published:2013-06-20 Issue:13 Volume:21 Page:15382
ISSN:1094-4087
Container-title:Optics Express
language:en
Short-container-title:Opt. Express

Author:

Koyama Takahisa,Yumoto Hirokatsu,Senba Yasunori,Tono Kensuke,Sato Takahiro,Togashi Tadashi,Inubushi Yuichi,Katayama Tetsuo,Kim Jangwoo,Matsuyama Satoshi,Mimura Hidekazu,Yabashi Makina,Yamauchi Kazuto,Ohashi Haruhiko,Ishikawa Tetsuya

Publisher

The Optical Society

Subject

Atomic and Molecular Physics, and Optics

Reference22 articles.

1. X-ray free-electron lasers

2. First lasing and operation of an ångstrom-wavelength free-electron laser

3. A compact X-ray free-electron laser emitting in the sub-ångström region

4. Femtosecond electronic response of atoms to ultra-intense X-rays

5. Atomic inner-shell X-ray laser at 1.46 nanometres pumped by an X-ray free-electron laser

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