Author:
Tong Yajun,Fan Jiadong,Nie Yonggan,Guo Zhi,Gao Zichen,Yuan Xinye,He Bo,Chen Jiahua,Zhang Difei,Luan Hui,Zhang Jianhua,Lu Donghao,Xie Minghan,Cheng Peng,Feng Chao,Liu Tao,Deng Haixiao,Liu Bo,Liu Zhi,Jiang Huaidong
Abstract
Shanghai Soft X-ray Free-Electron Laser (SXFEL) is the first X-ray free-electron laser facility in China. The initial commissioning of the beamline was carried out in May 2021. Herein, we present a status report and the first experimental results obtained during the early commissioning of Kirkpatrick-Baez (KB) mirrors for the Coherent Scattering and Imaging (CSI) endstation, including three types of diagnostics. A bright X-ray focal spot of less than 3 μm was achieved by using edge-scan and silicon ablation imprint measurements. In order to confirm the spot size, the attenuated beam and full beam are used respectively for the two measurement methods.
Subject
Physical and Theoretical Chemistry,General Physics and Astronomy,Mathematical Physics,Materials Science (miscellaneous),Biophysics
Cited by
4 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献