In situ single-grain peak profile measurements on Ti–7Al during tensile deformation-Reference-Cited by-同舟云学术

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In situ single-grain peak profile measurements on Ti–7Al during tensile deformation

Published:2009-10 Issue:1-2 Volume:524 Page:46-54
ISSN:0921-5093
Container-title:Materials Science and Engineering: A
language:en
Short-container-title:Materials Science and Engineering: A

Author:

Lienert U.,Brandes M.C.,Bernier J.V.,Weiss J.,Shastri S.D.,Mills M.J.,Miller M.P.

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference34 articles.

1. Three-dimensional X-ray structural microscopy with submicrometre resolution

2. Characterization of three-dimensional crystallographic distributions using polychromatic X-ray microdiffraction

3. Tracking: a method for structural characterization of grains in powders or polycrystals

4. Three-dimensional maps of grain boundaries and the stress state of individual grains in polycrystals and powders

5. Formation and Subdivision of Deformation Structures During Plastic Deformation

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