Investigation of interfacial behavior in miniaturized solder interconnects

Author:

Magnien J.,Khatibi G.,Lederer M.,Ipser H.

Funder

Austrian Federal Government

Christian Doppler Forschungsgesellschaft

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference34 articles.

1. A review of mechanical properties of lead-free solders for electronic packaging;Ma;J. Mater. Sci.,2009

2. Size effects in small scaled lead-free solder joints;Zimprich;J. Mater. Sci. Mater. Electron.,2008

3. Characterization of stress–strain response of lead-free solder joints using a digital image correlation technique and finite-element modeling;Khatibi;J. Electron. Mater.,2013

4. G. Khatibi, H. Ipser, M. Lederer, B. Weiss, Influence of miniaturization on mechanical reliability of lead-free solder interconnects, in: K.N. Subramanian (Ed.), Lead-Free Solders: Materials Reliability for Electronics, Wiley Blackwell, 2012, pp. 445–485.

5. I.E. Anderson, Development of Sn-Ag-Cu and Sn-Ag-Cu-X alloys for Pb-free electronic solder applications, in: K.N. Subramanian (Ed.), Lead-Free Electronic Solders: A Special Issue of the Journal of Materials Science: Materials in Electronics, Springer US, Boston, MA, 2007, pp. 55–76.

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