Growth behavior of compound layers in Sn/Cu/Sn diffusion couples during annealing at 433–473K
Author:
Publisher
Elsevier BV
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Reference16 articles.
1. Interdiffusion and reaction in bimetallic Cu-Sn thin films
2. Temperature Aging of External Connections Condensation Soldered to Ti-Pd-Au Thin Films
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