Author:
Grube R.,Fretwurst E.,Lindström G.
Cited by
15 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Research of Si and GaAs diode structures by Ion Beam Induced Charge (IBIC) collection;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1997-07
2. Study of localised radiation damage to PIPS detectors by a scanning ion microprobe: Measured effects and the consequences for STIM analysis;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1997-07
3. Microbeam studies of single-event effects;IEEE Transactions on Nuclear Science;1996-04
4. Optimization of ion‐beam induced charge microscopy for the analysis of integrated circuits;Journal of Applied Physics;1995-04-15
5. A comparison between MeV protons and α particles for IBIC analysis;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1994-03