Author:
Breese M.B.H.,Sow C.H.,Jamieson D.N.,Watt F.
Subject
Instrumentation,Nuclear and High Energy Physics
Cited by
7 articles.
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1. Structural and electrical characterisation of semiconductor materials using a nuclear microprobe;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1998-03
2. Recent results in ion beam induced charge microscopy: Unconnected junction contrast and an assessment of single contact IBIC;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1997-07
3. The Legnaro ion microprobe in low current experiments;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1997-07
4. A review of ion beam induced charge microscopy for integrated circuit analysis;Materials Science and Engineering: B;1996-12
5. Testing of radiation detectors by IBIC imaging;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1996-06