Ion-beam-induced charge-collection imaging of CMOS ICs

Author:

Sexton F.W.,Horn K.M.,Doyle B.L.,Laird J.S.,Cholewa M.,Saint A.,Legge G.J.F.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference13 articles.

1. Nuclear microprobe imaging of single-event upsets

2. Single event upset imaging with a nuclear muprobe

3. Proc. Int. Workshop on Radiation Effects of Semconductor Devices for Space Applications;Horn,1992

4. Proc. 3rd Int. Conference on Nuclear Microprobes;Horn,1993

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