New developments in IBIC for the study of charge transport properties of radiation detector materials

Author:

Jakšić M,Pastuović Ž,Tadić T

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Cited by 10 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Ion Microbeam Studies of Charge Transport in Semiconductor Radiation Detectors With Three-Dimensional Structures: An Example of LGAD;Frontiers in Physics;2022-05-13

2. Semiconductor Characterization by Scanning Ion Beam Induced Charge (IBIC) Microscopy;ISRN Materials Science;2013-01-17

3. Single ion hit detection set-up for the Zagreb ion microprobe;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2012-04

4. Radiation damage microstructures in silicon and application in position sensitive charged particle detection;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2005-04

5. IBIC Studies of structural defect activity in different polycrystalline silicon material;Vacuum;2003-05

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