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Single ion hit detection set-up for the Zagreb ion microprobe

  • Published:2012-04 Issue: Volume:277 Page:140-144
  • ISSN:0168-583X
  • Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
  • language:en
  • Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Smith R.W.,Karlušić M.,Jakšić M.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference36 articles.

1. Single event upset imaging with a nuclear microprobe;Doyle;Nucl. Instrum. Meth. Phys. Res. B,1992

2. The JAERI high energy;Tanaka;Heavy ion microprobe system and single hit technique, Nucl. Instrum. Meth. Phys. Res. B,1993

3. A review of ion beam induced charge microscopy;Breese;Nucl. Instrum. Meth. Phys. Res. B,2007

4. New developments in IBIC for the study of charge transport properties of radiation detector materials;Jakšić;Nucl. Instrum. Meth. Phys. Res. B,1999

5. Off-axis STIM nuclear microprobe analysis;Sjöland;Nucl. Instrum. Meth. Phys. Res. B,1996

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