Ion beam induced charge collection (IBICC) studies of cadmium zinc telluride (CZT) radiation detectors
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference10 articles.
1. Mapping of Large Area Cadmium Zinc Telluride (CZT) Wafers: Apparatus and Methods
2. Charge collection ion microscopy: Imaging of defects in semiconductors with a positive ion microbeam
3. Microcircuit imaging using an ion‐beam‐induced charge
4. Ion-beam-induced charge-collection imaging of CMOS ICs
5. Time-resolved ion beam induced charge collection (TRIBICC) in micro-electronics
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1. The Effect of Radiation Damage on the Charge Collection Efficiency of Silicon Avalanche Photodiodes;IEEE Transactions on Nuclear Science;2022
2. Nuclear microprobe investigation of the effects of ionization and displacement damage in vertical, high voltage GaN diodes;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2017-08
3. Study on the bias-dependent effects of proton-induced damage in CdZnTe radiation detectors using ion beam induced charge microscopy;Micron;2016-09
4. Sub-Micron Resolution of Localized Ion Beam Induced Charge Reduction in Silicon Detectors Damaged by Heavy Ions;IEEE Transactions on Nuclear Science;2015-12
5. Degradation of the charge collection efficiency of an n-type Fz silicon diode subjected to MeV proton irradiation;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2015-04
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