1. Multiple scattering double compton model: determination of intrinsic efficiencies by calculating electron energies;Journal of Nuclear Science and Technology;2023-09-12
2. An accurate determination of the K-shell X-ray fluorescence yield of silicon;X-Ray Spectrometry;2012-02-09
3. The Guelph PIXE software package IV;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2010-10
4. Escape peak ratios in silicon X-ray charge coupled devices (CCDs);Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;1997-01
5. Monte Carlo simulation of the response of Si(Li) X-ray detectors to proton induced K X-rays of light elements (12 ≦ Z ≦ 32) applied to efficiency determination;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1987-09