An accurate determination of the K-shell X-ray fluorescence yield of silicon
Author:
Affiliation:
1. Guelph-Waterloo Physics Institute; University of Guelph; Guelph; Ontario; Canada; N1G 2W1
2. Physikalisch-Technische Bundesanstalt (PTB); Abbestraβe 2-12; 10587; Berlin; Germany
Publisher
Wiley
Subject
Spectroscopy
Link
http://onlinelibrary.wiley.com/wol1/doi/10.1002/xrs.2378/fullpdf
Reference55 articles.
1. Atomic radiative and radiationless yields for K and L shells
2. W. Bambyek Proceedings of the International Conference on X-Ray and Inner Shell Processes in Atoms, Molecules and Solids
3. A Review, Bibliography, and Tabulation of K, L, and Higher Atomic Shell X‐Ray Fluorescence Yields
4. Erratum: “A Review, Bibliography, and Tabulation of K, L, and Higher Atomic Shell X-Ray Fluorescence Yields” [J. Phys. Chem. Ref. Data 23, 339 (1994)]
5. E. Schönfeld H. Janβen Physikalische-Technische Bundesanstalt Report PTB-Ra-37 1995
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