The national synchrotron light source VUV and soft x-ray beam lines: Performance characteristics-Reference-Cited by-同舟云学术

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The national synchrotron light source VUV and soft x-ray beam lines: Performance characteristics

Published:1982-04 Issue:1-2 Volume:195 Page:155-162
ISSN:0167-5087
Container-title:Nuclear Instruments and Methods in Physics Research
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research

Author:

Klaffky Roger W.,Howells Malcolm R.,Williams Gwyn P.,Takacs Peter Z.,Godel Jules B.

Publisher

Elsevier BV

Subject

General Engineering

Reference8 articles.

1. Current schemes for National Synchrotron Light Source UV beamlines

2. M.R. Howells, these Proceedings, p. 17.

3. J.M. Bennett, private communication.

Cited by 14 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. X-ray refractive index of silicon in the range 400 to 1100eV;Journal of Physics and Chemistry of Solids;1992-10

2. Characterization of SiO2/Si heterostructures by soft x‐ray reflection;Journal of Applied Physics;1991-02

3. Investigation of interfacial roughness of InxGa1−xAs epitaxial layers on GaAs and InP substrates by soft x‐ray reflectivity;Journal of Applied Physics;1991-01-15

4. The characteristics of the initial three synchrotron radiation beam lines at SRRC;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;1990-05

5. Interfacial roughness in InAs/GaAs heterostructures determined by soft x‐ray reflectivity;Journal of Applied Physics;1989-10-15

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