The optimization of a rutherford backscattering geometry for enhanced depth resolution-Reference-Cited by-同舟云学术

The optimization of a rutherford backscattering geometry for enhanced depth resolution

Author:

Williams J.S.

Publisher

Elsevier BV

Subject

General Medicine

Reference43 articles.

1. Proc. Conf. on Ion beam surface layer analysis,1973

2. Proc. Conf. on Application of ion beams to metals,1974

5. Proc. Conf. on Application of ion beams to metals;De Bonte,1974

Cited by 98 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Analysis of Mo/Si multilayers by means of RBS;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2013-12

2. High Energy Ion Beam Analysis Techniques;Materials Science and Technology;2006-09-15

3. Evaluation of depth resolution with time-of-flight medium energy backscattering;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2006-02

4. Elastic forward analysis using ions: A useful tool for H and light elements determination;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2002-08

5. Determination of the optimum experimental conditions for enhanced depth resolution in RBS using He ions;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1996-01