Microanalysis of Si and S in GaSb by direct observation of resonant nuclear reactions-Reference-Cited by-同舟云学术

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Microanalysis of Si and S in GaSb by direct observation of resonant nuclear reactions

Published:1971-12 Issue:2 Volume:97 Page:211-217
ISSN:0029-554X
Container-title:Nuclear Instruments and Methods
language:en
Short-container-title:Nuclear Instruments and Methods

Author:

Chemin J.F.,Roturier J.,Saboya B.,Petit G.Y.

Publisher

Elsevier BV

Subject

General Medicine

Reference9 articles.

1. Microanalysis by the direct observation of nuclear reactions using a 2 MeV Van de Graaff

2. Mesure par réactions nucléaires résonnantes du ralentissement et de la dispersion en énergie de protons

3. The level structure of 71Ge

4. Levels ofGa69andGa71via the (n, n′γ) Reactions

5. Smoothing and Differentiation of Data by Simplified Least Squares Procedures.

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Selected Low Energy Nuclear Reaction Data;Ion Beam Handbook for Material Analysis;1977

2. Material Analysis by Means of Nuclear Reactions;New Uses of Ion Accelerators;1975

3. Lattice location of low‐Z impurities in medium‐Z targets using ion‐induced x rays. I. Analytical technique;Journal of Applied Physics;1974-02

4. Principles and applications of ion beam techniques for the analysis of solids and thin films;Thin Solid Films;1973-07

5. Impurity Depth Profiles by Microanalysis Techniques;IEEE Transactions on Nuclear Science;1972

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