Lattice location of low‐Z impurities in medium‐Z targets using ion‐induced x rays. I. Analytical technique
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1663278
Reference12 articles.
1. Microanalysis of Si and S in GaSb by direct observation of resonant nuclear reactions
2. X-Ray Production by Alpha-Particle Impact
3. Universal Cross Sections forK-Shell Ionization by Heavy Charged Particles. I. Low Particle Velocities
4. The location of impurity atoms in crystals using characteristic x-ray generation by channelled protons
5. Channeling of MeV Projectiles in Tungsten and Silicon
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1. Spatial Distribution of Pr3+ and F- Ions in Ca1-xPrxF2+x Luminescent Thin Films;Materials Science Forum;1999-07
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