Comparison of kinematic X-ray diffraction and backscattering spectrometry — strain and damage profiles in garnet-Reference-Cited by-同舟云学术

Comparison of kinematic X-ray diffraction and backscattering spectrometry — strain and damage profiles in garnet

Published:1981-12 Issue:1-3 Volume:191 Page:80-86
ISSN:0167-5087
Container-title:Nuclear Instruments and Methods in Physics Research
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research

Author:

Paine B.M.,Speriosu V.S.,Wieluński L.S.,Glass H.L.,Nicolet M.A.

Publisher

Elsevier BV

Subject

General Engineering

Reference12 articles.

1. Backscattering spectrometry,1978

2. Elements of X-ray diffraction;Cullity,1956

3. The determination of lattice strain in proton-bombarded regions of single-crystal gallium arsenide, using precision X-ray measurements

4. Theory of X-ray diffraction in crystals;Zachariasen,1945

5. Application de la théorie dynamique de la diffraction X à l'étude de la diffusion du bore et du phosphore dans les cristaux de silicium

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