Application de la théorie dynamique de la diffraction X à l'étude de la diffusion du bore et du phosphore dans les cristaux de silicium-Reference-Cited by-同舟云学术

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Application de la théorie dynamique de la diffraction X à l'étude de la diffusion du bore et du phosphore dans les cristaux de silicium

Published:1968-01-23 Issue:1 Volume:24 Page:99-102
ISSN:0567-7394
Container-title:Acta Crystallographica Section A: Crystal Physics, Diffraction, Theoretical and General Crystallography
language:
Short-container-title:Acta Cryst Sect A

Author:

Burgeat J.,Taupin D.

Publisher

International Union of Crystallography (IUCr)

Link

http://journals.iucr.org/a/issues/1968/01/00/a05853/a05853.pdf

Cited by 75 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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4. Solution of the inverse problem of X-ray diffraction on periodic InGaN/GaN/Al2O3 nanostructures;Technical Physics Letters;2004-06

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