Delay fault diagnosis in sequential circuits based on path tracing-Reference-Cited by-同舟云学术

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Delay fault diagnosis in sequential circuits based on path tracing

Published:1995-11 Issue:3 Volume:19 Page:199-218
ISSN:0167-9260
Container-title:Integration
language:en
Short-container-title:Integration

Author:

Girard P.,Landrault C.,Pravossoudovitch S.,Rodriguez B.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Software

Reference34 articles.

1. Sequential circuit diagnosis based on formal verification techniques;Cabodi,1992

2. Diagnosis oriented test pattern generation;Camurati,1990

3. DIATEST: a fast diagnostic test pattern generator for combinational circuits;Grüning,1991

4. Fault diagnosis in sequential circuits based on an effect-cause analysis;Abramovici,1980

5. Critical path tracing-an alternative to fault simulation;Abramovici,1983

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Bridging fault diagnostic tool based on IDDQ probabilistic signatures, circuit layout parasitics and logic errors;IET Computers & Digital Techniques;2007

2. Path delay fault diagnosis in combinational circuits with implicit fault enumeration;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2001

3. An improved fault diagnosis algorithm based on path tracing with dynamic circuit extraction;Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159)

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