1. Failure Localization of Logic Circuits Using Voltage Contrast Considering State of Transistors;2013 22nd Asian Test Symposium;2013-11
2. A Comprehensive Framework for Logic Diagnosis of Arbitrary Defects;IEEE Transactions on Computers;2010-03
3. A fault-simulation-based approach for logic diagnosis;2009 4th International Conference on Design & Technology of Integrated Systems in Nanoscal Era;2009-04
4. A case study on logic diagnosis for System-on-Chip;2009 10th International Symposium on Quality Electronic Design;2009-03
5. Improving Diagnosis Resolution without Physical Information;4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008);2008-01