Electron detection EXAFS in He and vacuum
Author:
Publisher
Elsevier BV
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference8 articles.
1. Depth dependence for extended x-ray-absorption fine-structure spectroscopy detected via electron yield in He and in vacuum
2. Electron-yield extended x-ray absorption fine structure with the use of a gas-flow electron detector
3. High‐pass photocathode x‐ray ionization chamber for surface EXAFS
4. X-ray Data Booklet;Pianetta,1985
5. Relaxation effects on auger energies
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