Electron-yield extended x-ray absorption fine structure with the use of a gas-flow electron detector
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.29.491/fulltext
Reference8 articles.
1. Extended x-ray absorption fine structure—its strengths and limitations as a structural tool
2. EXAFS and surface‐EXAFS studies in the soft x‐ray region using electron yield spectroscopy
3. Conversion electron Mössbauer spectroscopy and the study of surface properties and reactions
4. Fluorescence detection of exafs: Sensitivity enhancement for dilute species and thin films
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