Quantitative analysis of elastic strains in GaAs/AlAs quantum dots-Reference-Cited by-同舟云学术

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Quantitative analysis of elastic strains in GaAs/AlAs quantum dots

Published:1996-09 Issue:1-4 Volume:227 Page:11-16
ISSN:0921-4526
Container-title:Physica B: Condensed Matter
language:en
Short-container-title:Physica B: Condensed Matter

Author:

Darhuber A.A.,Holy V.,Bauer G.,Wang P.D.,Song Y.P.,Sotomayor Torres C.M.,Holland M.C.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference8 articles.

1. X-ray Bragg diffraction on periodic surface gratings

2. X-ray diffraction from corrugated crystalline surfaces and interfaces

3. Triple crystal x‐ray diffractometry of periodic arrays of semiconductor quantum wires

4. X-ray diffraction from low-dimensional structures

5. X-ray triple-crystal diffractometry of defects in epitaxic layers

Cited by 8 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. High-resolution X-ray diffraction in crystalline structures with quantum dots;Physics-Uspekhi;2015-05-31

2. Strain Engineering of Nanowire Multi-Quantum Well Demonstrated by Raman Spectroscopy;Nano Letters;2013-09-03

3. Optical and structural properties of GaN nanopillar and nanostripe arrays with embedded InGaN∕GaN multi-quantum wells;Journal of Applied Physics;2006-09

4. Comparison of strain field in cleaved XSTM specimen with un-cleaved InAs/GaAs quantum dot nanostructure;Surface Science;2004-08

5. The fine structure of X-ray diffuse scattering in the vicinity of high-angle superlattice Bragg reflections;Acta Crystallographica Section A Foundations of Crystallography;2003-10-28

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