X-ray triple-crystal diffractometry of defects in epitaxic layers-Reference-Cited by-同舟云学术

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X-ray triple-crystal diffractometry of defects in epitaxic layers

Published:1994-08-01 Issue:4 Volume:27 Page:551-557
ISSN:0021-8898
Container-title:Journal of Applied Crystallography
language:
Short-container-title:J Appl Cryst

Author:

Holý V.,Wolf K.,Kastner M.,Stanzl H.,Gebhardt W.

Publisher

International Union of Crystallography (IUCr)

Subject

General Biochemistry, Genetics and Molecular Biology

Link

http://journals.iucr.org/j/issues/1994/04/00/wi0141/wi0141.pdf

Cited by 42 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Treatment of multiple-beam X-ray diffraction in energy-dependent measurements;Journal of Synchrotron Radiation;2024-01-01

2. Structure Quality of LuFeO3 Epitaxial Layers Grown by Pulsed-Laser Deposition on Sapphire/Pt;Materials;2019-12-21

3. Time-resolved X-ray reciprocal space mapping of a crystal in an external electric field;Physics-Uspekhi;2019-02

4. Optical Characterization of Thin Films by Means of Imaging Spectroscopic Reflectometry;Optical Characterization of Thin Solid Films;2018

5. Ellipsometric and reflectometric characterization of thin films exhibiting thickness non-uniformity and boundary roughness;Applied Surface Science;2017-11

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