Author:
Toledano-Luque M.,Kaczer B.,Simoen E.,Roussel Ph. J.,Veloso A.,Grasser T.,Groeseneken G.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference12 articles.
1. RTS amplitudes in decananometer MOSFETs: 3-D simulation study
2. Capture and emission kinetics of individual Si:SiO2interface states
3. B. Kaczer, T. Grasser, J. Martin-Martínez, E. Simoen, M. Aoulaiche, Ph. J. Roussel, G. Groeseneken, in: Proc. IEEE Int. Rel. Phys. Symp., vol. 55, 2009.
4. M. Toledano-Luque, B. Kaczer, Ph. J. Roussel, R. Degraeve, J. Franco, T. Kauerauf, T. Grasser, G. Groeseneken, as discussed at the IEEE SISC 2010, San Diego, CA, USA.
5. Temperature dependence of the emission and capture times of SiON individual traps after positive bias temperature stress
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