Author:
Gaillard N.,Mariolle D.,Bertin F.,Gros-Jean M.,Proust M.,Bsiesy A.,Bajolet A.,Chhun S.,Djebbouri M.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference25 articles.
1. G.S. Lujan, et al., in: Proceedings of the 32nd ESSDERC 583, 2002.
2. Improvement of threshold voltage deviation in damascene metal gate transistors
3. Y. Rosenwaks, et al., Direct measurement of semiconductors surface states parameters using Kelvin probe force microscopy, 2003.
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