MOSFET output characteristics after oxide breakdown-Reference-Cited by-同舟云学术

MOSFET output characteristics after oxide breakdown

Published:2007-01 Issue:1 Volume:84 Page:31-36
ISSN:0167-9317
Container-title:Microelectronic Engineering
language:en
Short-container-title:Microelectronic Engineering

Author:

Fernández R.,Rodríguez R.,Nafría M.,Aymerich X.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference18 articles.

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4. A. Cester, S. Cimino, A. Paccagnella, G. Ghidini, G. Guegan, in: IRPS Proceedings, 2003, pp. 189–195.

5. T. Pompl, H. Wurzer, M. Kerber, R.C.W. Wilkins, I. Eisele, in: IRPS Proceedings, 1999, pp. 82–87.

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