1. Y. Shin, Non-volatile memory technologies for beyond 2010, in: 2005 Symp. VLSI Tech. Dig., (2005) pp. 156–159.
2. Innovative technologies for high density non-volatile semiconductor memories
3. Recent developments on Flash memory reliability
4. S. Lai, Tunnel oxide and ETOXtm flash scaling limitation, in: Int’l NonVolatile Memory Technology Conference, (1998) pp. 6–7.
5. R. Muralidhar, R.F. Steimle, M. Sadd, R. Rao, C.T. Swift, E.J. Prinz, J. Yater, L. Grieve, K. Harber, B. Hradsky, S. Straub, B. Acred, W. Paulson, W. Chen, L. Parker, S.G.H. Anderson, M. Rossow, T. Merchant, M. Paransky, T. Huynh, D. Hadad, K.-M. Chang, B.E. White Jr., A 6V embedded 90nm silicon nanocrystal nonvolatile memory, in: IEDM Tech. Dig., 2003, pp. 601–604.