Author:
Walczyk D.,Walczyk Ch.,Schroeder T.,Bertaud T.,Sowińska M.,Lukosius M.,Fraschke M.,Tillack B.,Wenger Ch.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference22 articles.
1. Embedded Memories for Nano-Scale VLSIs,2009
2. B. de Salvo (Ed.), Silicon Non-Volatile Memories: Paths of Innovation, Wiley-ISTE, 2009.
3. Electrical observations of filamentary conductions for the resistive memory switching in NiO films
4. C. Kügeler, J. Zhang, S. Hoffmann-Eifert, S.K. Kim, R. Waser, J. Vac. Sci. Technol. B 29 (2011) 01AD01.
5. Ch. Walczyk, Ch. Wenger, D. Walczyk, M. Lukosius, I. Costina, M. Fraschke, J. Dabrowski, A. Fox, D. Wolansky, S. Thiess, E. Miranda, B. Tillack, T. Schroeder, J. Vac. Sci. Technol. B 29 (1) (2011) 01AD02.
Cited by
48 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献