A methodology for accelerated testing by mechanical actuation of MEMS devices-Reference-Cited by-同舟云学术

A methodology for accelerated testing by mechanical actuation of MEMS devices

Published:2012-07 Issue:7 Volume:52 Page:1382-1388
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

McMahon Michael,Jones Jeff

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference19 articles.

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3. Applied life data analysis, (Wiley series in probability and statistics);Nelson,1982

4. Accelerated testing: statistical models, test plans, and data analysis (Wiley series in probability and statistics);Nelson,2004

5. Foucher B. Presentation of the EDA programme POLYNOE, CANEUS Workshop. California: NASA Ames Research Center; 1/3/2009 – 6/3/2009.

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