Highly Accelerated Life Testing of Ceramic Capacitors Using Capacitor Test Board by Lognormal Method and Integrated with PLM Solutions

Abstract

Compare to previous decay, now days consumer expectation is very high about the electronic product what they are going to purchase. The consumer analyzes the quality of the product with the product competitors. The electronic component manufacturer is under immersive pressure to show their reliability of their product and maintain their place in the market. Reliability engineering helps to announce the guaranty period of the electronic product. Highly Accelerated Life Testing (HALT) is the latest technology in the reliability field for testing the electronic components. The highly accelerated life testing is conducted at accelerated stress level to generate more failure data in a short span of time. The Capacitor test board is used to test the most commonly used X5R Ceramic Capacitor to identify the time to failure data (TTF). The time to failure data follows a statistical distribution to find out the mean time to failure data (MTTF) at accelerated conditions. The time to failure data of capacitor at accelerated condition is converted to actual conditions and integrated with PLM solution using SQL Query, Java and HTML. The integration helps to reduce product time to market and increase the profitability of the manufacturer.