Author:
Machouat A.,Haller G.,Goubier V.,Lewis D.,Perdu P.,Pouget V.,Fouillat P.,Essely F.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference5 articles.
1. Rapid diagnostic of circuit marginalities using dynamic laser stimulation;Y Liao;IEEE Trans Dev Mater Reliab,2006
2. Shmoo ploting: the black art of IC testing;Baker;IEEE Des Test Comput,1997
3. Bruce MR. Soft defect localization (SDL) on ICs. In: International symposium for testing and failure analysis; 2002. p. 21–6.
4. Rowlette JA, Eiles TM. Critical timing analysis in microprocessors using near-IR laser assisted device alteration (LADA). In: International test conference; 2003. p. 264–73.
5. Hawkins C. CMOS defect electronics, tutorials. In: International symposium for testing and failure analysis; 2003.
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