Author:
Deyine A.,Sanchez K.,Perdu P.,Battistella F.,Lewis D.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference14 articles.
1. Beaudoin F et al. Laser stimulation applied to dynamic IC diagnostics. In: ISTFA; 2003. p. 371–7.
2. Cole E. No-destructive IC defect localization using optical beam-based imaging. In: CICC; 2008.
3. Theory of optical beam induced current images of defects in semiconductors;Wilson;J Appl Phys,1987
4. Nikawa K, Tozaki S. Novel OBIC observation method for detecting defects in Al stripes under current stressing. In: ISTFA; 1993. p. 303–9.
5. Nikawa K et al. New capabilities of OBIRCh method for fault localization and defect detection. In: ATS; 1997.
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