Prediction of Long-term Immunity of a Phase-Locked Loop-Reference-Cited by-同舟云学术

Prediction of Long-term Immunity of a Phase-Locked Loop

Published:2012-11-30 Issue:6 Volume:28 Page:791-802
ISSN:0923-8174
Container-title:Journal of Electronic Testing
language:en
Short-container-title:J Electron Test

Author:

Boyer A.,Ben Dhia S.,Li B.,Lemoine C.,Vrignon B.

Publisher

Springer Science and Business Media LLC

Subject

Electrical and Electronic Engineering

Link

http://link.springer.com/content/pdf/10.1007/s10836-012-5335-y.pdf

Reference16 articles.

1. AEC-Q100-Rev-FAutomotive Electronics Council (2003) Component Technical Committee, Stress test qualification for integrated circuits

2. Bernstein JB, Gurfinkel M, Li X, Walters J, Shapira Y, Talmor M (2006) „Electronic circuit reliability modeling. Microelectron Reliab 46(9–11):1957–1979

3. Boyer A, Ndoye AC, Ben Dhia S, Guillot L, Vrignon B (2009) Characterization of the evolution of IC emissions after accelerated aging. IEEE Trans EMC 51(4):892–900

4. Boyer A, Li B, Ben Dhia S, Lemoine C (September 2010) Impact of aging on the immunity of a mixed-signal circuit. EMC Europe 2010, Wroclaw, Poland

5. Boyer A, Ben Dhia S, Lemoine C, Vrignon B (November 6–9, 2011) Construction and Evaluation of the Susceptibility Model of an Integrated Phase-Locked Loop. 8th International Workshop on electromagnetic Compatibility of Integrated Circuits, Dubrovnik, Croatia

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