Conducted EMI susceptibility analysis of a COTS processor as function of aging-Reference-Cited by-同舟云学术

Conducted EMI susceptibility analysis of a COTS processor as function of aging

Published:2020-11 Issue: Volume:114 Page:113884
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Benfica Juliano,Vargas Fabian,Soares Matheus Fay,Schramm Dorian

Funder

CNPq

CAPES

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference18 articles.

1. Integrated circuits immunity evaluation by different test procedures;Franco Fiori,2000

2. On the susceptibility of micro-controller to radio frequency interference;Baffreau,2002

3. Basis of Electromagnetic Compatibility of Integrated Circuits - A Modeling Approach Using IC-EMC;Boyer,2017

4. Sonia Ben Dhia, “A new methodology for EMC prediction of integrated circuits after aging”;Ghfiri;IEEE Trans. Electromagnetic Compatibility,2019

5. MIL-STD-883H – Burn-in Test Method and Procedure for Microcircuits: Part 1015.9.

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