Resilience Articulation Point (RAP): Cross-layer dependability modeling for nanometer system-on-chip resilience

Author:

Herkersdorf Andreas,Aliee Hananeh,Engel Michael,Glaß Michael,Gimmler-Dumont Christina,Henkel Jörg,Kleeberger Veit B.,Kochte Michael A.,Kühn Johannes M.,Mueller-Gritschneder Daniel,Nassif Sani R.,Rauchfuss Holm,Rosenstiel Wolfgang,Schlichtmann Ulf,Shafique Muhammad,Tahoori Mehdi B.,Teich Jürgen,Wehn Norbert,Weis Christian,Wunderlich Hans-Joachim

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference35 articles.

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4. Riif-reliability information interchange format;Evans,2012

5. Generalized fault modeling for logic diagnosis;Wunderlich,2010

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