Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference14 articles.
1. Blish R, Dellin T, Huber S, Johnson M, Maiz J, Likins B, Lycoudes N, McPherson J, Peng Y, Peridier C, Preussger A, Prokop G, Tullos L. Critical reliability challenges for the IRTS. Int Sematech, Austin, TX, tech rep technol transfer #03024377A-TR; 2003.
2. Local Vth variability and scalability in silicon-on-thin-box (SOTB) CMOS with small random-dopant fluctuation;Sugii;IEEE Trans Electron Dev,2010
3. Simulation of statistical variability in nano MOSFETs;Asenov;Symp VLSI Technol,2007
4. Dierickx B. Scaling below 90nm: designing with unreliable components; 2007.
5. Papanikolaou A. Reliability issues in deep deep submicron technologies: time-dependent variability and its impact on embedded system design. In: Proc IFIP int conf very large scale integr; 2006. p. 342–7.
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