High-power silicon P–i–N diode with cathode shorts: The impact of electron irradiation-Reference-Cited by-同舟云学术

High-power silicon P–i–N diode with cathode shorts: The impact of electron irradiation

Published:2013-05 Issue:5 Volume:53 Page:681-686
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Pína L.,Vobecký J.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference16 articles.

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