Reliability improvement of automotive electronics based on environmental stress screen methodology-Reference-Cited by-同舟云学术

Reliability improvement of automotive electronics based on environmental stress screen methodology

Published:2013-09 Issue:9-11 Volume:53 Page:1235-1238
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Chan S.I.,Kang J.H.,Jang J.S.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference20 articles.

1. Furukawa Yoshimi, Kawamura Seiji. Automotive electronics system, software, and local area, network, CODES+ISSS; 2006.

2. 2004/104/EC, the “Automotive EMC Directive”, Official Journal of the EU, L 337/13-L 337/58, Nov. 13 2004.

3. Practical reliability engineering;O’Connor,2012

4. RADC-TR-86-138, RADC Guide to environmental stress screening; 1986.

5. MIL-HDBK-344A, Environmental stress screening of electronic equipment, Department of Defense; 1986.

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