Optimisation of burn-in time considering the hidden loss of quality deviations in the manufacturing process
Author:
Affiliation:
1. School of Reliability and Systems Engineering, Beihang University, Beijing, China
2. China Association for Quality, Beijing, China
Funder
National Natural Science Foundation of China
National Defense Pre-Research Foundation of China
Publisher
Informa UK Limited
Subject
Industrial and Manufacturing Engineering,Management Science and Operations Research,Strategy and Management
Link
https://www.tandfonline.com/doi/pdf/10.1080/00207543.2016.1262081
Reference32 articles.
1. An integrated model for optimisation of production and quality costs
2. Variability and reliability analysis of CNFET technology: Impact of manufacturing imperfections
3. A Bayesian Approach for One-Shot Device Testing With Exponential Lifetimes Under Competing Risks
4. Extending integrated-circuit yield-models to estimate early-life reliability
5. Reliability improvement of automotive electronics based on environmental stress screen methodology
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