Time resolved imaging using synchronous picosecond Photoelectric Laser Stimulation

Author:

Douin A.,Pouget V.,De Matos M.,Lewis D.,Perdu P.,Fouillat P.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference6 articles.

1. Picosecond hot electron light emission from submicron complementary metaloxide- semiconductor circuits;Tsang;Appl Phys Lett,1997

2. Eiles TM, Woods DL, Rao VR. Optical probing of flip-chip-packaged microprocessors. Proc International Solid-State Circuits Conference 2000; p. 220–1.

3. Rowlette JA, Eiles TM. Critical Timing Analysis in Microprocessors Using Near-IR Laser Assisted Device Alteration (LADA). Proc Of International Test Conference 2003; p. 264–73.

4. Sanchez K, Desplats R, Beaudoin F, Perdu P, Dudit S, Woods G, Lewis D. Dynamic Laser Delay Variation Mapping (DVM) Implementations and Applications. International Symposium for Testing.

5. Time-resolved scanning of integrated circuits with a pulsed laser: application to transient fault injection in an ADC;Pouget;IEEE Trans Inst Meas,2004

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