Author:
Douin A.,Pouget V.,De Matos M.,Lewis D.,Perdu P.,Fouillat P.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference6 articles.
1. Picosecond hot electron light emission from submicron complementary metaloxide- semiconductor circuits;Tsang;Appl Phys Lett,1997
2. Eiles TM, Woods DL, Rao VR. Optical probing of flip-chip-packaged microprocessors. Proc International Solid-State Circuits Conference 2000; p. 220–1.
3. Rowlette JA, Eiles TM. Critical Timing Analysis in Microprocessors Using Near-IR Laser Assisted Device Alteration (LADA). Proc Of International Test Conference 2003; p. 264–73.
4. Sanchez K, Desplats R, Beaudoin F, Perdu P, Dudit S, Woods G, Lewis D. Dynamic Laser Delay Variation Mapping (DVM) Implementations and Applications. International Symposium for Testing.
5. Time-resolved scanning of integrated circuits with a pulsed laser: application to transient fault injection in an ADC;Pouget;IEEE Trans Inst Meas,2004
Cited by
4 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献