Time-Resolved Scanning of Integrated Circuits With a Pulsed Laser: Application to Transient Fault Injection in an ADC-Reference-Cited by-同舟云学术

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Time-Resolved Scanning of Integrated Circuits With a Pulsed Laser: Application to Transient Fault Injection in an ADC

Published:2004-08 Issue:4 Volume:53 Page:1227-1231
ISSN:0018-9456
Container-title:IEEE Transactions on Instrumentation and Measurement
language:en
Short-container-title:IEEE Trans. Instrum. Meas.

Author:

Pouget V.,Lewis D.,Fouillat P.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Instrumentation

Link

http://xplorestaging.ieee.org/ielx5/19/29167/01316010.pdf?arnumber=1316010

Cited by 31 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Characteristics and Applications of Pulsed Laser-Induced Single-Event Effects;Radiation Effects on Integrated Circuits and Systems for Space Applications;2019

2. Temporal characteristic analysis of single event effects in pulse width modulator;Nuclear Science and Techniques;2017-05-26

3. Laser equipment for hardness evaluation of semiconductor elements exposed to heavy charged particles (Review);Instruments and Experimental Techniques;2016-09

4. Laser Testing Methodology for Diagnosing Diverse Soft Errors in a Nanoscale SRAM-Based FPGA;IEEE Transactions on Nuclear Science;2014-12

5. Impact of negative bias temperature instability on the single-event upset threshold of a 65nm SRAM cell;Microelectronics Reliability;2013-09

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